Current use cases
Perovskite Metrology
LuxFlux is proud of its comprehensive metrology portfolio for perovskites. The metrology is already used in R&D and industrial environments. Please contact […]
3D Metrology
LuxFlux has developed a technology to measure tiny dimensions. Attached a sample measurement of a metal workpiece with turning grooves and laser […]
Hyperspectral image data for high-precision color measurement
LuxFlux has developed a technology to visualize a wide variety of material properties. For example, differences in structure and color can be […]
News
LuxFlux @ VISION in Stuttgart (Oct 4-6)
LuxFlux will again participate in the VISION trade show in Stuttgart. We are looking forward to welcoming you at our booth!
Opsis HSI-1700
Luxflux CEO, Dr Jan Makowski gives a quick demo of the Opsis HSI-1700 Imaging Spectro Scanner, developed in partnership with EKO Instruments.
LuxFlux at PhotonicsWest @ San Francisco, February 2020
LuxFlux GmbH will be presenting at SPIE Photonics West to be held in San Francisco from 4th – 6th February 2020. We […]
