Current use cases
LuxFlux is proud of its comprehensive metrology portfolio for perovskites. The metrology is already used in R&D and industrial environments. Please contact […]
LuxFlux has developed a technology to measure tiny dimensions. Attached a sample measurement of a metal workpiece with turning grooves and laser […]
LuxFlux has developed a technology to visualize a wide variety of material properties. For example, differences in structure and color can be […]
LuxFlux will again participate in the VISION trade show in Stuttgart. We are looking forward to welcoming you at our booth!
Luxflux CEO, Dr Jan Makowski gives a quick demo of the Opsis HSI-1700 Imaging Spectro Scanner, developed in partnership with EKO Instruments.
LuxFlux GmbH will be presenting at SPIE Photonics West to be held in San Francisco from 4th – 6th February 2020. We […]