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Current use cases

Perovskite Metrology

LuxFlux is proud of its comprehensive metrology portfolio for perovskites. The metrology is already used in R&D and industrial environments. Please contact […]

3D Metrology

LuxFlux has developed a technology to measure tiny dimensions. Attached a sample measurement of a metal workpiece with turning grooves and laser […]

Hyperspectral image data for high-precision color measurement

LuxFlux has developed a technology to visualize a wide variety of material properties. For example, differences in structure and color can be […]

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LuxFlux supports .NET

LuxFlux provides another interface to the Windows developer community. The .NET API of fluxEngine allows software developers to write applications in programming […]

LuxFlux @ VISION in Stuttgart (Oct 4-6)

LuxFlux will again participate in the VISION trade show in Stuttgart. We are looking forward to welcoming you at our booth!

Opsis HSI-1700

Luxflux CEO, Dr Jan Makowski gives a quick demo of the Opsis HSI-1700 Imaging Spectro Scanner, developed in partnership with EKO Instruments.