Perovskite Metrology

LuxFlux is proud of its comprehensive metrology portfolio for perovskites. The metrology is already used in R&D and industrial environments. Please contact […]

3D Metrology

LuxFlux has developed a technology to measure tiny dimensions. Attached a sample measurement of a metal workpiece with turning grooves and laser […]

Opsis HSI-1700

Luxflux CEO, Dr Jan Makowski gives a quick demo of the Opsis HSI-1700 Imaging Spectro Scanner, developed in partnership with EKO Instruments.

LuxFlux project partner FarmingIOS

The project was initiated by cluster organization PhotonicsBW and is funded by the German ministry of research. Further details you find here.